The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, Fourier Transfer Infrared Spectroscopy, Differential Scanning Calorimeter, Profilometer, and Thermogravimetric analysis.
Features:
Covers material characterization techniques and the development of advanced characterization technologyIncludes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraintsDiscusses advanced material characterization technology in the microstructural and property characterization fieldsReviews both practical and theoretical explanations of approaches for characterizing microstructure and propertiesOffers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies
This book is aimed at graduate students and researchers in materials science and engineering.